Abstract
Photothermal spectroscopy has found a wide range of applications as a method of monitoring thermal, optical and recombination parameters of semiconductors. We consider microphone detection, widely used in photoacoustic spectroscopy, and piezoelectric detection. Both methods require knowledge of the temperature distribution in the sample and in its surroundings, the support surface and gas. For the microphone signal, we simulated the temperature at one of the sample surfaces; for the piezoelectric signal, we simulated the spatial temperature distribution orthogonal to the sample surface. We modeled an idealized semiconducting sample and one with surface defects. We found that the amplitude and phase spectra vary between the methods, enabling determination of optical and thermal parameters.
Highlights
Photothermal spectroscopy has been developed to investigate the thermal and optical properties of semiconductors [1,2,3] since it is very sensitive and is complementary toThis article is part of the selected papers presented at the 18th International Conference on Photoacoustic and Photothermal Phenomena.Int J Thermophys (2017) 38:2 absorption and photoluminescence spectroscopy
The most frequently used detection method in photothermal spectroscopy is the microphone method, in which periodic changes of surface temperature are measured by a microphone that detects changes of the gas pressure in the photoacoustic chamber [4]
One must know the temperature on the surface of the sample and for piezoelectric detection, the spatial distribution orthogonal to the sample surface must be known
Summary
Photothermal spectroscopy has been developed to investigate the thermal and optical properties of semiconductors [1,2,3] since it is very sensitive and is complementary to. This article is part of the selected papers presented at the 18th International Conference on Photoacoustic and Photothermal Phenomena
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