Abstract
This paper describes a new method for measuring both the thermal conductivity and thermal diffusivity for solid materials, referred to as the new plane source (NPS) method. This method is quite similar to the Extended dynamic plane source (EDPS) method; however, the essential difference is the location of the temperature measurement. The NPS measures the temperature of the specimen at both the heat source and also at the heat sink using a thermocouple. The accuracy of the NPS method was verified by comparing the measurement results with the step-wise transient (SWT) method for two solid materials: silica glass and polymethylmethacrylate (PMMA). The difference in results between the NPS method and the SWT method was found to be 0.6%. The results of conductivity measurements by the NPS method of glass and PMMA were 1.019 and 0.1904 W·K−1 m−1, respectively. As for the measured thermal diffusivities, they were 0.504 and 0.1136 mm2 s−1, respectively. The standard uncertainties of the estimates were less than 0.9%.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
