Abstract

The in-plane magnetic anisotropy and its dispersion in rf-sputtered (Co93Zr7)100-xREx thin films (RE=Pr, Nd and Tb; x < 3.5) were investigated by two different techniques: transverse biased initial susceptibility technique where measurements are performed based on the magnetooptical Kerr effect and by ferromagnetic resonance technique. The films exhibit a very well-defined in-plane magnetic anisotropy with negligible long-range fluctuations of the anisotropy along the easy axis, so the anisotropy dispersion is discussed in terms of the ripple, which is related to the magnetic local anisotropy. The anisotropy dispersion values obtained by both techniques are compared, which allow us to determine the role of the large angle ripple in the anisotropy dispersion and its relationship with local anisotropy. We also analyze the advantages and disadvantages of each technique.

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