Abstract

Featuring high levels of achievable oxygen non-stoichiometry δ, Ce1−xZrxO2−δ solid solutions (CZO) are crucial for application as oxygen storage materials in, for example, automotive three-way catalytic converters (TWC). The use of CZO in form of films combined with simple manufacturing methods is beneficial in view of device miniaturization and reducing of TWC manufacturing costs. In this study, a comparative microstructural and electrochemical characterization of film and conventional bulk CZO is performed using X-ray diffractometry, scanning electron microscopy, and impedance spectroscopy. The films were composed of grains with dimensions of 100 nm or less, and the bulk samples had about 1 µm large grains. The electrical behavior of nanostructured films and coarse-grained bulk CZO (x > 0) was qualitatively similar at high temperatures and under reducing atmospheres. This is explained by dominating effect of Zr addition, which masks microstructural effects on electrical conductivity, enhances the reducibility, and favors strongly electronic conductivity of CZO at temperatures even 200 K lower than those for pure ceria. The nanostructured CeO2 films had much higher electrical conductivity with different trends in dependence on temperature and reducing atmospheres than their bulk counterparts. For the latter, the conductivity was dominantly electronic, and microstructural effects were significant at T < 700 °C. Nanostructural peculiarities of CeO2 films are assumed to induce their more pronounced ionic conduction at medium oxygen partial pressures and relatively low temperatures. The defect interactions in bulk and film CZO under reducing conditions are discussed in the framework of conventional defect models for ceria.

Highlights

  • Ceria/zirconia mixed oxides Ce1–xZrxO2–d (CZO) are crucial components of state-of-the-art technologies to minimize hazardous emissions of combustion engines in the environment

  • The Ce1-xZrxO2-d pellets and films were characterized by X-ray diffraction (XRD) in parallel beam (2h–x) geometry enabled by Gobel mirror within 2h = (25-100)° with 0.02° resolution and 1300 s integration time per step using the Bruker D8 ADVANCE X-ray diffractometer (Bruker AXS GmbH, Karlsruhe, Germany) with a Cu-Ka1 ? CuKa2 radiation (k = 1.5419 A )

  • In order to elucidate the possible differences in the temperature- and pO2-dependent behavior of film and bulk ceramic ceria/zirconia mixed oxides, first a comparative study of their microstructural peculiarities is performed

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Summary

Introduction

Ceria/zirconia mixed oxides Ce1–xZrxO2–d (CZO) are crucial components of state-of-the-art technologies to minimize hazardous emissions of combustion engines in the environment. The development of oxygen non-stoichiometries (facilitated by high temperatures and decreasing oxygen partial pressure, pO2) in ceria-based compounds is caused by the loss of oxygen and related formation of positively charged oxygen vacancies that are compensated by conduction electrons (reduced Ce). They enhance the electrical conductivity r [14,15,16,17], which, becomes an indirect measure of the reduction degree. From an application point of view, understanding the relations between microstructure and reducibility combined with utilization of simple fabrication methods would allow for the development of Ce1-xZrxO2–d films with superior catalytic properties, paving the way toward less costly high-performance miniaturized TWCs

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