Abstract
AbstractThree hypersensitive resistant, six partially resistant (slow rusting), and one susceptible spring bread wheat (Triticum aestivum L.) cultivars were evaluated for grain yield, test weight, and kernel weight under artificially created epiphytotics of leaf rust disease (caused by Puccinia recondita f. sp. tritici) with and without fungicide protection for three years. Rusted plot yields were 4 percent lower compared to fungicide-protected plot yields for cultivars with hypersensitive resistance. In rusted plots, grain yield and kernel weight averaged 8 percent less for cultivars with partial resistance but varied from 2 to 20 percent less depending on cultivar. The susceptible check cultivar, Yecora 70, averaged 27 percent lower grain yield, 22 percent lower kernel weight, and 6 percent lower test weight in rusted plots. Slight reduction in test weight was also observed for each cultivar. Losses in grain yield could, therefore, be reduced to levels similar to those of hypersensitive resistant cultivars by the use of partial resistance. We discuss the sustainability of partial genetic resistance to leaf rust. Since partial resistance is expected to be durable, and since rust levels and effects on yield in farmers' fields are likely to be less than in this experimental plot study, partial resistance should give long-lasting resistance at a negligible cost in yield that is insufficient to justify the use of fungicides.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.