Abstract

As a valuable process for surface modification of materials, ion implantation is eminent to improve mechanical properties, electrochemical corrosion resistance and oxidation behaviors of varieties of materials. To investigate and compare the oxidation behaviors of Zircaloy-4, implantation of yttrium ion and cerium ion were respectively employed by using an MEVVA source at the energy of 40 keV with a dose ranging from 1×10 16 to 1×10 17 ions/cm 2. Subsequently, weight gain curves of the different specimens including as-received Zircaloy-4 and Zircaloy-4 specimens implanted with the different ions were measured after oxidation in air at 500 °C for 100 min. It was obviously found that a significant improvement was achieved in the oxidation behaviors of implanted Zircaloy-4 compared with that of the as-received Zircaloy-4, and the oxidation behavior of cerium-implanted Zircaloy-4 was somewhat better than that of yttrium-implanted specimen. To obtain the valence and the composition of the oxides in the scale, X-ray photoemission spectroscopy was used in the present study. Glancing angle X-ray diffraction, employed to analyze the phase transformation in the oxide films, showed that the addition of yttrium transformed the phase from monoclinic zirconia to tetragonal zirconia, yet the addition of cerium transformed the phase from monoclinic zirconia to hexagonal zirconia. In the end, the mechanism of the improvement of the oxidation behavior was discussed.

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