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Abstract
Aluminum oxide films produced by anodization were tested with ramp and step voltages. Mean times to breakdown decreased quasi-exponentially with increasing applied field. Mean times to breakdown on step tests τ bs were 5 to 25 times shorter than mean times to breakdown τ br on ramp tests. Calculations of τ br with values of τ bs showed fair agreement with the observations, but discrepancies could be caused by statistical scatter and changes in space charges.
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