Abstract
The dielectric thin-film coating on high-power optical components is often the weakest region and will fail at elevated optical fluences. A comparison of single-layer coatings of ZrO2, LiF, Ta2O5, SiN, and SiO2 along with anti-reflection (AR) coatings optimized at 1064 nm comprised of ZrO2 and Ta2O5 was made, and the results of photothermal common-path interferometry (PCI) and a laser-induced damage threshold (LIDT) are presented here. The coatings were grown by radio frequency (RF) sputtering, pulsed direct-current (DC) sputtering, ion-assisted electron beam evaporation (IAD), and thermal evaporation. Test regimes for LIDT used pulse durations of 9.6 ns at 100 Hz for 1000-on-1 and 1-on-1 regimes at 1064 nm for single-layer and AR coatings, and 20 ns at 20 Hz for a 200-on-1 regime to compare the //ZrO2/SiO2 AR coating.
Highlights
A need for an AR coating for high-power fused-silica Q-switch components centered at 1064 nm with the ability to survive 20 J/cm2 prompted this small study to determine the material dependence on the absorption by the photothermal common-path interferometry (PCI) method and a laser-induced damage threshold (LIDT)
path common‐path interferometry (PCI) measurements were measured at the Ginzton Lab at Stanford University, and atomic force microscopy (AFM) was used in conjunction
The deposition techniques used in this trial were an ion-assisted electron beam with thermal evaporation, radio frequency (RF) sputtering, pulsed direct-current (DC)
Summary
A need for an AR coating for high-power fused-silica Q-switch components centered at 1064 nm with the ability to survive 20 J/cm prompted this small study to determine the material dependence on the absorption by the photothermal common-path interferometry (PCI) method and a laser-induced damage threshold (LIDT). In Phase 1 of the study, single layers circa 500 nm were grown and characterized by spectrophotometric transmission, PCI, and where possible, LIDT. Helia Photonics Ltd. on various substrates, including silicon, Borofloat 33, and Spectrosil 2000 glass witness samples, and, in the case of a few designs, on final fused-silica Q-switch components. LIDT measurements were carried out by Lidaris Ltd. Coatings 2016, 6, 20 with an optical Nomarski assessment at the University of Glasgow. Additional optical measurements including ellipsometric and spectrophotometric assessments were carried out at the University of the
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