Comparison of ROSE, C3/IC, and SIR as an effective cleanliness verification test for post soldered PCBA

Abstract

PurposeThe purpose of this paper is to evaluate and compare the effectiveness and sensitivity of different cleanliness verification tests for post soldered printed circuit board assemblies (PCBAs) to provide an understanding of current industry practice for ionic contamination detection limits.Design/methodology/approachPCBAs were subjected to different flux residue cleaning dwell times and cleanliness levels were verified with resistivity of solvent extract, critical cleanliness control (C3) test, and ion chromatography analyses to provide results capable of differentiating different sensitivity levels for each test.FindingsThis study provides an understanding of current industry practice for ionic contamination detection using verification tests with different detection sensitivity levels. Some of the available cleanliness monitoring systems, particularly at critical areas of circuitry that are prone to product failure and residue entrapment, may have been overlooked.Research limitations/implicationsOnly Sn/Pb, clean type flux residue was evaluated. Thus, the current study was not an all encompassing project that is representative of other chemistry‐based flux residues.Practical implicationsThe paper provides a reference that can be used to determine the most suitable and effective verification test for the detection of ionic contamination on PCBAs.Originality/valueFlux residue‐related problems have long existed in the industry. The findings presented in this paper give a basic understanding to PCBA manufacturers when they are trying to choose the most suitable and effective verification test for the detection of ionic contamination on their products. Hence, the negative impact of flux residue on the respective product's long‐term reliability and performance can be minimized and monitored effectively.