Comparison of parameters describing stratified surface topography

Abstract

There are a lot of methods of two-process surface topography description. Some parameters can be computed from material ratio graph. There are included in ISO standards. The methods described in ISO standards 13565-2 (Pk, Ppk, Pvk, Pmr1 and Pmr2) and 13565-3 (Pmq, Pvq and Pmq) are compared in this paper. Profiles with given values of Pmq, Pvq and Pmq parameters and wavelengths were modelled. For these profiles, material ratio curve and Pk, Ppk, Pvk, Pmr1 and Pmr2 parameters were calculated. As a result, dependencies among parameters from ISO 13565-3 and ISO 13565-2 standard were found.