Abstract

Optical reflectivity properties of various dielectric multilayer sequences of thin films are investigated. Wavelength, incident angle, TE, TM polarization parameters are changed and omnidirectional polarization and wavelength independent highly reflective structures are researched. In this research 1D periodic, Fibonacci, Thue–Morse, double-period and Rudin–Shapiro sequences are considered. It is found that the perfect reflective structure can be obtained with single period Rudin–Shapiro structure with a high order.

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