Abstract
The magnetic images of a magnetic reference sample were compared using point and thin-film magnetic force microscopy (MFM) tips. The thin film MFM tip was made by magnetron sputtering of an amorphous metal. The point MFM tip was made by an ion milling process that produces a small magnetic particle on the cantilever. Our results clearly demonstrated that the volume of magnetic material involved in the tip-sample interaction is much reduced in the case of the point tip compared to that of the thin film tips. By comparing the magnetic images of a tri-bit pattern on a magnetic reference sample, we observed an improved resolution using a point MFM tip.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
