Comparison of lifetime-based methods for 2D phosphor thermometry in high-temperature environment

Abstract

This paper discusses the currently available techniques for 2D phosphor thermometry, and compares the performance of two lifetime-based methods: high-speed imaging and the dual-gate. High-speed imaging resolves luminescent decay with a fast frame rate, and has become a popular method for phosphor thermometry in recent years. But it has disadvantages such as high equipment cost and long data processing time, and it would fail at sufficiently high temperature due to a low signal-to-noise ratio and short lifetime. The dual-gate method only requires two images on the decay curve and therefore greatly reduces cost in hardware and processing time. A dual-gate method for phosphor thermometry has been developed and compared with the high-speed imaging method through both calibration and a jet impingement experiment. Measurement uncertainty has been evaluated for a temperature range of 473–833 K. The effects of several key factors on uncertainty have been discussed, including the luminescent signal level, the decay lifetime and temperature sensitivity. The results show that both methods are valid for 2D temperature sensing within the given range. The high-speed imaging method shows less uncertainty at low temperatures where the signal level and the lifetime are both sufficient, but its performance is degraded at higher temperatures due to a rapidly reduced signal and lifetime. For T > 750 K, the dual-gate method outperforms the high-speed imaging method thanks to its superiority in signal-to-noise ratio and temperature sensitivity. The dual-gate method has great potential for applications in high-temperature environments where the high-speed imaging method is not applicable.