Abstract

An ensemble Monte Carlo simulation have been carried out to study temperature and doping dependencies of electron drift velocity in ZnS, GaN and 6H-SiC. We study how electrons, initially in thermal equilibrium, drift under the action of an applied electric field within bulk of these materials. Calculations are made using a non-parabolic effective mass energy band model, Monte Carlo simulation that includes all of the major scattering mechanisms. The band parameters used in the simulation are extracted from optimized pseudopotential band calculations to ensure excellent agreement with experimental information and ab-initio band models. For all materials, it is found that electron velocity overshoot only occurs when the electric field is increased to a value above a certain critical field, unique to each material. This critical field is strongly dependent on the material parameters. Transient velocity overshoot has also been simulated, with the sudden application of fields up to 600 kVm-1, appropriate to the gate-drain fields expected within an operational field effect transistor. The electron drift velocity relaxes to the saturation value of about 1.5×105 ms-1 within 3 ps, for all crystal structures. Keywords: Ensemble Monte Carlo, drift velocity, transient velocity, pseudopotential.

Highlights

  • Recent improvements in material quality and contact technology for GaN, ZnS and 6H-SiC-based materials system have led to a rapid progress in devices

  • These materials are usually grown in the [0001] direction and in the [111] direction. These are polar axes, and, these materials exhibit strong lattice polarization effects. These effects are uniquely suited for applications in high temperature piezoelectronics and for applications in pyroelectric sensors

  • The wide band-gap semiconductors are of potential interest as a suitable material for high power electronics and because of their direct band gap are benefit for optoelectronic devices, too

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Summary

Introduction

Recent improvements in material quality and contact technology for GaN, ZnS and 6H-SiC-based materials system have led to a rapid progress in devices. It is evident that in high temperatures the wide band-gap semiconductors like GaN, ZnS and 6H-SiC have much lower intrinsic carrier concentrations than Si and GaAs (Betazzi et al, 2007). In order to calculate the electron drift velocity for large electric fields, consideration of conduction band satellite valleys is necesasry.

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