Abstract
We have investigated the transport properties of grain boundaries of Tl1 Ba2Ca2Cu3Ox(Tl-(1223)) and Tl2Ba2Ca1Cu2Ox(Tl-(2212)) epitaxial thin films. Both Tl-(1223) and TI-(2212) thin films were grown on SrTiO3 bicrystal substrates with various tilt angles (5°, 10°, 15°, 24° and 36.8°) of [001] direction by laser ablation and post-annealing method. For both Tl-(1223) and Tl-(2212) phases, the grain boundaries Jc for large tilt angles (θ≥15°) at 5K dropped by almost one order of magnitude, compared to the intragrain Jc. Moreover, hysteretic magnetic-field dependence of grain boundaries Je was observed for large tilt angles in both phases. However, it was found that the grain boundaries for low tilt angles (θ≤10°) did not work as a weak link and retained high Jc. We found that the critical tilt angle was the same value (10°) in both phases and greater than that (θ≈5°) for Y1Ba2Cu3O7-δ system. These results suggest that large tilt angle grain boundaries act as weak links for TI-Ba-Ca-Cu-0 systems.
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