Abstract
Multi-Stage Interconnection Networks (MINs) are being used in various parallel processing applications. Main concern of this research work is to check out the fault tolerability of recently proposed MINs and find out the best one among all the considered MINs. Here “faulty” means the switching element (SE) which is in busy state or dead state. One theorem is also proposed in the paper that basically checks the fault tolerability of a MIN. Fault analysis is done for all the MINs, i.e., from three-stage interconnection networks to five-stage interconnection networks. Finally, a highly fault tolerant MIN is obtained among all the discussed MINs.
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