Abstract
Optical measurements on semiconductor thin films can be used to derive their complex dielectric function. In a log-log graph, the imaginary part near the plasma frequency tends to have two linear segments, one slope denoting the Drude and the other the quantum region. The quantum region is represented by a von Baltz and Escher asymptotic expression. An empirical screening function for the charged impurities is derived by matching the Drude and quantum expressions at the relatively narrow transition frequency band between Drude and quantum regions. This empirical expression and the corresponding theoretical Thomas-Fermi screening function are applied to a series of In 2O 3 and CdIn 2O 4 films to show that the theory systematically underestimates the screening by a factor of 2–3.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
