Comparison of dual-window and convolution scatter correction techniques using the Monte Carlo method

Abstract

In order to improve the accuracy of SPECT measurements, correction methods have to be used. Two different scatter correction techniques-the dual-window (DW) technique and the convolution (CV) technique-were compared using projection data, simulated by the Monte Carlo method. Comparison with measured data was also made to validate the accuracy of the Monte Carlo code. The main goal was to investigate how well the estimated scatter distributions, using these two scatter correction techniques, fit the simulated, true scatter distribution of the projection data obtained in the photo-peak window. The scatter distributions predicted by the CV technique were found to be consistently lower than those simulated by the Monte Carlo method in the part of the scatter distribution corresponding to the locations of the sources. The DW technique gives lower estimates of the scatter distribution. However, the scatter distribution estimated by the DW technique and the simulated scatter distribution bear a close resemblance to each other.