Comparison of different methodologies for estimating gold thickness in multilayer samples using XRF spectra

Abstract

A detailed comparison of methodologies for assessing gold leaf thickness in multilayer samples using the XRF technique was performed. Standard three-layer samples and six methods of analysis were used: two-line ratio of one or two elements, de Boer's analytical procedure, multivariate PLS analysis and percentage concentration of elements in the layers. The accuracy of each method and the consistency among the results of the methods emerged. The PLS method and the analytical approach might be preferred because they are faster.