Abstract
ABSTRACTNanoparticles are of interest in many applications since their decreased size may give them properties that are very different from bulk material. Often nanoparticle properties such as size (diameter) and size distribution are evaluated using transmission electron microscopy (TEM). These parameters, size and size distribution, can be more easily obtained from digitized TEM images by mapping particle signal to black and background pixel to white in a process known as thresholding then performing an algorithm known as a particle analysis. The goal of this study was to compare the ability of several popular thresholding algorithms to segment TEM images. Performance of the thresholding algorithms was evaluated through qualitative and quantitative measures. Results show that the choice of a thresholding algorithm will strongly affect the results obtained from particle analysis.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
