Comparison of analytical methods for the determination of trace amounts of strontium and yttrium by photon induced X-ray fluorescence techniques in lateritic materials

Abstract

Three different analytical methods for the determination of strontium and yttrium in Venezuelan latterites by radioisotope induced X-ray fluorescence are compared, also with results from conventional wavelength dispersive X-ray fluorescence. The samples analyzed were from Cerro Impacto, Venezuela. The photon-induced energy dispersive X-ray fluorescence system consisted of a109Cd (7 mCi) source for excitation of the characteristic K X-rays for strontium and yttrium. The detection system employed a high resolution Si(Li) detector and was completely controlled by a PDP-11/05 processor. Of the three analytical methods described, the internal standard-thin film technique was shown to be slightly superior to the conventional standard calibration curve method and the standard additon/dilution procedure. This can be explained by considering the effectiveness of the compensation of the sources of errors by these methods. It should also be noted that in the case of wavelength dispersive X-ray fluorescence, an about 5–10 times greater sample is needed, which is a limitation compared to energy dispersive X-ray fluorescence in some cases. Finally, typical relative standard deviations of the energy dispersive X-ray fluorescence methods were about 10–15% for the range of about 100–100 ppm of strontium and yttrium; these values are acceptable considering the large degree of heterogeneity in this type of geological material.