Abstract
The Universal Verification Methodology (UVM) has become a de facto standard in today's functional verification of digital designs. However, it is rarely used for the verification of Designs Under Test containing Real Number Models. This paper presents a new technique using UVM that can be used in order to compare models of analog circuitry on different levels of abstraction. It makes use of statistic metrics. The presented technique enables us to ensure that Real Number Models used in chip projects match the transistor level circuitry during the whole life cycle of the project.
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