Abstract
The layered compounds of TaCl5-graphite intercalation compound, second-stage stacking sequence: C–TaCl5–C–C and tantalum carbosulfide were studied by scanning tunneling microscopy. Although both materials consist of layers the information on their content gathered by scanning tunneling microscopy is quite different for both. The second-stage TaCl5-graphite intercalation compound provides detailed information concerning the superstructure and positions of adjacent chlorine atoms at the upper graphene layer. Tantalum carbosulfide is a layered compound with a stacking sequence of S–Ta–C–Ta–S. Direct information from the first (sulfur) layer only could be obtained. Measured amplitudes are distinguishable for the sulfur layer, this may indicate the occurrence of charge density waves.
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More From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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