Abstract
Determination of electromechanical piezoceramic material parameters is usually done by fitting the measured input electrical impedance of the piezoceramic sample to the theoretical modelling equation for the input electrical impedance of the unloaded free piezoceramic resonator. The input electrical impedance of the sample is usually measured by using low voltage or current magnitude frequency sweeping signals. In this work, the complex material parameters of piezoceramic samples are determined in the real operating conditions by using the high voltage short impulse excitation signals.The input electrical impedance determined in the impulse mode around thickness extensional vibration mode (TE) and calculated piezoceramic parameters (clamped dielectric permittivity, electromechanical coupling factor, elastic stiffness and piezoelectric constant) are compared to the results obtained by using the low voltage magnitude frequency sweeping signals. When impulse excitation is used, the series resonance frequency is decreased and the input electrical impedance magnitude at series resonance is increased, which means that overall losses included in the piezoceramic parameters are increased.The complex material parameters obtained from the input electrical impedances determined by using the low voltage magnitude sweeping signal and high level short impulse signals are included in the KLM theoretical model describing the piezoceramic sample behaviour around TE mode. Better agreement between measured and theoretically determined current magnitude response around TE mode has been obtained, in the KLM model, when piezoceramic parameters determined by using the impulse signal excitations are included in the modelling.The physical reason for increase of the losses in piezoceramic material could lie in the fact that the ferroelectric domains in the piezoceramic respond harder on very short impulse excitation signals than on continuous frequency sweeping signals which are usually used in determination of piezoelectric material parameters.
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