Abstract
We present the charge state distributions of highly charged ions extracted from an electron beam ion trap (EBIT). The distributions were obtained in the two different extraction modes, pulsed mode and leaky mode. The number ratio between adjacent charge state ions, which is an important quantity to measure dielectronic recombination cross sections with an EBIT, is compared between the two extraction modes. The results are also compared with recent theoretical predictions by Zhang et al. [17].
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.