Comparative Testing of Devices in a Spherical Near Field System and Plane Wave Generator

Abstract

The Plane Wave Generator (PWG) is an array of elements generating an approximately plane wave over a finite volume in the test area called Quiet Zone (QZ). The plane wave condition can be achieved in close proximity to the array with suitably optimized complex coefficients. The PWG thus achieve far-field testing conditions in a manner similar to the Compact Antenna Test Range (CATR) but with a reduced distance to the QZ [1–2]. As a complete system the PWG has the advantage of reduced physical size compared to the a CATR with equivalent testing capabilities, in particular at lower frequencies. In [3–4], the concept of a high performance, dual polarized PWG supporting up to 1:10 bandwidth was presented. A prototype of a dual polarized PWG has been designed, manufactured and tested in the 600MHz to 6GHz frequency range.This paper presents the initial verification of the prototype PWG. The testing is performed using a representative analog beam forming network with narrow bandwidth. The QZ uniformity of the PWG is verified by spherical near-field measurements and back-propagation. The peak gain of a low directivity antenna is measured at different distances in the QZ and compared to reference measurements in a spherical near-field system. The aim of the comparison is to access the measurement accuracy of the PWG.