Abstract
The comparative study was made on the effect of Zirconium ions (Zr4+) and Calcium ions (Ca2+) dopant on NiO properties. The electroceramic of Ni(1-x)ZrxO and Ni(1-x)CaxO was prepared by using solid state reaction method. The different amount of Zr4+ was studied. XRD analysis on sintered sample showed the single phase formation of Ni(1-x)ZrxO and Ni(1-x)CaxO. The dielectric behavior of Ni(1-x)ZrxO with x = 0.02 mole % Zr4+ exhibited highest dielectric constant (700) with moderate dielectric loss (0.16). Meanwhile, the dielectric behavior of Ni(1-x)CaxO samples show that the sample doped with x = 0.01 mole % Ca2+ obtained the lowest dielectric loss (0.05) but moderate in dielectric constant (123), measured at 1MHz.
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