Abstract
The authors report a comparative study on ex situ passivation of a near-surface GaAs0.86P0.14/Al0.6Ga0.4As quantum well using various sulfide solutions and nitrogen plasma treatments. The built-in surface electric field is changed via band bending by applying various surface passivation conditions. The band bending is measured using x-ray photoelectron spectroscopy. Reduction in surface electric field in the range of 10–35 kV/cm is observed depending on different passivation conditions. The photoreflectance spectra show enhancement in intensity and blueshift of ∼3 meV accompanied by significant reduction in the broadening parameter of the observed e1-lh1 transitions. Among all the methods studied here, passivation by Na2S⋅xH2O is found to be most effective as it removes the native oxide layer completely leading to almost flat band condition.
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