Abstract
A study of x-ray sources for the purpose of characterizing x-ray instrumentation is presented. Specifically, in the soft x-ray wavelength region, we compare a proton-induced x-ray emission (PIXE) source to a conventional electron-beam x-ray source, and to a radioactive α fluorescence x-ray source. We find that PIXE has intense line radiation with respect to background continuum [C. K. Li et al., Rev. Sci. Instrum. 63, 4843 (1992)]. This desirable feature, as well as others, will make PIXE potentially a useful tool for characterizing x-ray detectors, optics, and filter.
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