Abstract
Cu x S thin films with different Cu to S molar ratios (0·33 and 0·43) have been deposited by spray pyrolysis method on glass and FTO coated glass substrates using an aqueous solution of copper (II) acetate and thiourea at a substrate temperature of 285°C. The structural, surface morphological, optical and electrical characterizations of the samples were carried out using XRD, FESEM, UV-Vis and PL spectrophotometer and four-probe apparatus, respectively. X-ray diffraction analysis showed that while the layer/glass sample has an individual CuS (covellite) crystalline phase, the layer/FTO sample includes two additional phases of Cu2S (chalcocite) and Cu1·8S (digenite) as well. Optical measurements showed that all these materials have a relatively high absorption coefficient (~5 × 104–2·3 × 105 cm − 1) in the visible region and direct bandgap of the layers was confirmed with the corresponding room temperature PL spectra. With the resistivity measurements at room and higher temperatures (up to 100°C) confirm that all samples are degenerate in nature with high electrical conductivities of ~103 (Ω.cm) − 1.
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