Abstract
Abstract X-ray photoelectron emission microscopy (XPEEM) provides valuable chemical information at the micron or submicron level and has been successfully applied to a wide range of materials. We have initiated a study of metal–matrix composites (MMCs) using this technique, aimed at understanding the interfacial interactions that occur between the metal matrix and the ceramic reinforcement. The experiments have been performed on Ti/SiC (fiber) MMCs and SiC fibers. We have found that the method of preparing the sample plays a critical role in understanding the results of the measurements. Samples prepared by polishing and sputtering were examined using an electric-field imaging photoelectron microscope (EFIPM), and fractured samples were studied with a magnetic-field imaging photoelectron microscope (MFIPM). While the EFIPM exhibited exellent elemental contrast and resolution, the data were flawed by artifacts introduced by both the polishing and the sputtering. Although the spatial resolution of the MFIPM was lower than the EFIPM, the ability to study fractured samples greatly facilitated interpretation of the data, which revealed the intrinsic chemical states of the sample. These results will be interpreted in terms of the impact of sample preparation on the application of XPEEM to MMCs and other complex systems.
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