Abstract

Further advancement of high-energy pulsed lasers requires a parallel development of appropriate optical components. Several different optical components, such as mirrors and antireflection-coated windows, which are essential for the design of HiLASE high average power lasers were tested. The following paper summarizes results on the measurements of laser-induced damage threshold of such components, and clearly shows their capabilities and limitations for such a demanding application.

Highlights

  • The laser-induced damage threshold (LIDT) is the highest quantity of laser radiation incident upon the optical component for which the extrapolated probability of damage is zero[1]

  • It is easy to understand why the LIDT is a key parameter for all optical components which will be used in design of any high-power laser systems

  • Damage threshold of samples tested at 10 ns pulse length

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Summary

Introduction

The laser-induced damage threshold (LIDT) is the highest quantity of laser radiation incident upon the optical component for which the extrapolated probability of damage is zero[1]. The importance of the LIDT of each optical component in such type of laser systems is reflected by the fact that the LIDT establishes the limits of maximum achievable energy of a whole laser system. The LIDT is a limiting factor for the laser beam distribution system (LBDS), a system of optical components used to deliver such powerful laser pulses toward an area of scientific and industrial application. Components were tested under laser radiation conditions according to their intended use at ps and ns pulse lengths for 103 (ns case) and 105 (ps case) pulses. All results will be used to identify respective components suitable for the HiLASE laser systems as well as for the further development of the LBDS. Pulse Maximal Polarization Repetition Spot beam Environment length pulses state rate diameter per site (1/e2, 0◦ AOI)

Motivation
Testing facility
Test conditions
Test procedure
Data collection
Damage threshold of samples tested at 10 ns pulse length
Damage threshold of samples tested at 1 ps pulse length
Damage morphology
Conclusion

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