Abstract
On thin layers of μm sized AIN particles, superficial enrichment of O, probably caused by atmospheric hydrolysis and/or oxidation, was detected by means of Auger Electron Spectroscopy (AES) combined with sputter depth profiling. By comparing the O/N ratio found at the surface with that of the bulk, determined by means of the carrier gas heat extraction (CGHE) method, surface enrichment appeared to be more pronounced for lower O coverages. Chemical speciation of O (H2O, CO2) was feasible using appropriate CGHE techniques. — Similarly, using AES and Secondary Ion Mass Spectrometry as depth profiling methods, surface enrichment of Si, C and O was found for two B4C powders, which had been coated by the sintering additive SiC. For this system, Laser Mass Microanalysis yielded additional information about chemical species. Combination of all applied methods led to comprehensive models of the natural and prepared particle coatings.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
