Comparative Analysis Four Different Ways of Calculating Yield Index SSSpk Based on Information of Control Chart, and Six Sigma, to Measuring the Process Performance in Industries: Case Study in Aden’s Oil Refinery, Yemen

Abstract

Process capability index PCIs have long been used to assess process efficiency in the manufacturing. While PCIs assess the process stability and efficiency, real measurements of product quality depended on estimate the standard deviation for a short-term variance was calculated as the base approach in several previous studies for measuring PCIs. Studies in recent years seek to estimate shift of the process mean from target. In today’s smart manufacturing production climate, manufacturers keep track of production performance. Since the deviance of process mean comparative to the target is different. This allows a more robust norm to be implemented by estimate the relative shift to describe the variance of process in Six Sigma ( SS ). For that purpose, this paper suggests an evaluation method by comparative analysis to four different ways of calculating yield indexes $S_{pk}$ based on six sigma and control information, of $\bar {X}_{S}$ chart. Moreover, this paper extends the univariate process index yield $SSS_{pk}$ to a multi- generalized yield index is called $SSMS_{pk}$ . An established an updated approach to assess univariate and multi-characteristic, based on understanding variation which is critical to quality (CTQ) and focusing on the position and actions of natural process tolerance between defined tolerances limits. To demonstrate the trueness verification proficiency of this approach, this paper includes an industrial case study to assess the process efficiency in Aden’s oil refinery, Yemen. The findings of this study indicated that the indexes which are calculating based on six sigma outperformed existing indices and that this study has important implications for industrial practitioners, researchers and quality control experts interested in the evaluation of process performance.