Comparation of X-ray diffraction pattern refinement using Rietica and MAUD of ZnO nanoparticles and nanorods

Abstract

ZnO nanoparticles and nanorods were synthesized using a simple co-precipitation method. X-ray diffractometry was used to investigate the purity and nanocrystallinity of the final powders. Rietveld refinements for x-ray diffraction data of the nanopowders have been done using Rietica and MAUD softwares. The study was to compare the adjusted parameters in the models where Voigt and pseudo-Voigt functions, respectively, are used as profiles adopted in the softwares. Refinements using Rietica gives Lorentzian and Gaussian peak broadening components and preferred orientation parameter. The peak broadening components can be used to estimate crystallite size and non-uniform microstrain. MAUD can directly give crystallite size and its distribution parameter, microstrain and preferred orientation value. Further study and investigation using scanning electron microscopy (SEM) are required to confirm the accuracy of the diffraction size results.