Compact echelle spectrometer employing a cross-grating

Abstract

The concept and the implementation of a compact and simplified echelle spectrometer are presented, and the working principle is demonstrated by first experimental measurements. The crucial element of the setup is a cross-grating, combining an echelle grating utilizing several higher diffraction orders (5th up to 11th) and a superposed perpendicular-oriented cross-dispersing grating. Two alternative manufacturing approaches for the cross-grating are presented and discussed. The first approach combines Talbot lithography for the deep echelle grating and interference lithography for the cross-dispersing structure. As a second approach, direct laser-beam writing was applied. The compact echelle spectrometer covers a spectral range from 380 to 700 nm and offers a spectral resolution of ∼2 nm.