Compact double-pass Echelle spectrometer employing a crossed diffraction grating.

Abstract

This contribution presents the design and implementation of a compact and robust Echelle-inspired cross-grating spectrometer which is arranged as a double pass setup. This allows use of the employed refractive elements for collimation of the incoming light and, after diffraction at the reflective crossed diffraction grating, for imaging the diffracted light onto the detector. The crossed diffraction grating combines the two dispersive functionalities of a classical Echelle spectrometer in a single element and is therefore formed by a superposition of two blazed linear gratings which are oriented perpendicularly. The refractive elements and the plane grating are arranged in a rigid objective group which is beneficial in terms of stability and robustness. The experimental tests prove that the designed resolving power of more than 300 is achieved for the addressed spectrum ranging from 400 nm to 1100 nm by using an entrance pinhole diameter of 105 µm. The utilization of a single mode fiber increases the resolving power to more than 1000, but leads to longer acquisition times.