Abstract
AbstractThe use of a CCD for detection of X‐rays and a focused or collimated beam of ionising radiation enables the design of a compact, wavelength‐dispersive X‐ray (WDX) spectrometer, with increased solid angle and tolerable loss of energy resolution. Experimental investigation of WDX spectrometer designs is rather expensive and time consuming, so in order to compare various designs, a numerical X‐ray tracing procedure (XTRACE) has been developed for the calculation of instrumental functions and solid angles. XTRACE has been applied to a range of candidate designs for downsized WDX spectrometers with CCD detection and flat, Von Hamos, Johann, Johansson and spherical crystals. Most of the crystal types studied for use in downsized WDX‐PIXE spectrometers are sensitive to sample surface rotation, which may affect the reproducibility of experimental conditions. Implications for construction of downsized WDX spectrometers for PIXE application using an ion microbeam are given. Copyright © 2011 John Wiley & Sons, Ltd.
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