Abstract
Atom probe tomography, and related methods, probe the composition and the three-dimensional architecture of materials. The software tools which microscopists use, and how these tools are connected into workflows, make a substantial contribution to the accuracy and precision of such material characterization experiments. Typically, we adapt methods from other communities like mathematics, data science, computational geometry, artificial intelligence, or scientific computing. We also realize that improving on research data management is a challenge when it comes to align with the FAIR data stewardship principles. Faced with this global challenge, we are convinced it is useful to join forces. Here, we report the results and challenges with an inter-laboratory call for developing test cases for several types of atom probe microscopy software tools. The results support why defining detailed recipes of software workflows and sharing these recipes is necessary and rewarding: Open source tools and (meta)data exchange can help to make our day-to-day data processing tasks become more efficient, the training of new users and knowledge transfer become easier, and assist us with automated quantification of uncertainties to gain access to substantiated results.
Highlights
Atom probe tomography (APT) (Miller, 2000; Gault et al, 2012; Larson et al, 2013; Lefebvre-Ulrikson et al, 2016) and field ion microscopy (FIM) (Müller, 1956a, 1956b; Wagner, 1982) belong to a family of microscopy techniques named atom probe microscopy (APM)
This material is available as supplementary material (Ceguerra, 2021) organized for each test case
The test case addresses the accuracy of the clustering analysis package OPTICS-APT (Wang et al, 2019b), which is based on the OPTICS algorithm (Ankerst et al, 1999), via synthetic data
Summary
Atom probe tomography (APT) (Miller, 2000; Gault et al, 2012; Larson et al, 2013; Lefebvre-Ulrikson et al, 2016) and field ion microscopy (FIM) (Müller, 1956a, 1956b; Wagner, 1982) belong to a family of microscopy techniques named atom probe microscopy (APM) These techniques take advantage of the physics of field evaporation to remove ions from the surface of a needleshaped specimen. Subsequent acceleration of these ions in an electric field towards a position-sensitive and time-of-flightrecording detector system enables measurements that can be used to reconstruct the atomic architecture of the specimen.
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