Comments on`On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope'by Morawiec & Bouzy (2006)

Abstract

The limitation of automatic indexing of electron diffraction patterns raised by Morawiec & Bouzy [(2006).J. Appl. Cryst.39, 101–103] is discussed. The theoretical problem related to the famous 180° ambiguity may be surmounted by adequate technical improvements. Three solutions to avoid misindexing are briefly described.