Abstract
Recently, Ghiringhelli et al. [Phys. Rev. B 73, 035111 (2006)] reported on the $d\text{\ensuremath{-}}d$ crystal field and charge-transfer excitations in MnO by using resonant inelastic x-ray scattering (RIXS). The data were analyzed with the single impurity Anderson model (SIAM) as well as with the crystal-field model (CFM), with both models providing very different parameters. The results of their CFM analysis are in conflict with the results obtained by analyzing electron-energy-loss spectroscopy (EELS) data with the same model.
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