Abstract

Ni et al (Research Articles, 20 March 2020, p. 1352) report bulk trap densities of 1011 cm-3 and an increase in interfacial trap densities by one to four orders of magnitude from drive-level capacitance profiling of lead halide perovskites. From electrostatic arguments, we show that the results are not trap densities but are a consequence of the geometrical capacitance and charge injection into the perovskite layer.

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