Comment on gchron-2022-4

Abstract

Secondary Ion Mass Spectrometry (SIMS) is a widely used technique for in-situ U–Pb geochronology of accessory minerals. Existing algorithms for SIMS data reduction and error propagation make a number of simplifying assumptions that degrade the precision and accuracy of the resulting U–Pb dates. This paper uses an entirely new approach to SIMS data processing that introduces the following improvements over previous algorithms. First, it treats SIMS measurements as compositional data, using logratio statistics. This means that, unlike existing algorithms, (a) its isotopic ratio estimates are guaranteed to be strictly positive numbers, (b) identical results are obtained regardless of whether data are processed as normal ratios (e.g. 206Pb / 238U) or reciprocal ratios (e.g. 238U / 206Pb), and (c) its uncertainty estimates account for the positive skewness of measured isotopic ratio distributions. Second, the new algorithm accounts for the Poissonian noise that characterises Secondary Electron Multipliers (SEM). By fitting the SEM signals using the method of maximum likelihood, it naturally handes low intensity ion beams, in which zero counts signals are common. Third, the new algorithm casts the data reduction process in a matrix format, and thereby captures all sources of systematic uncertainty. These include significant inter-sample error correlations that arise from the commonly used Pb/U-UO(2)/U calibration curve. The new algorithm has been implemented in a new software package called simplex. simplex was written in R and can be used either online, offline or from the command line. The program can handle SIMS data from both Cameca and SHRIMP instruments.