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Abstract
We have controllably positioned, with nanometre precision, single CdSe quantum dots referenced to a registration template such that the location of a given nanoparticle on a macroscopic (≈1 cm2) sample surface can be repeatedly revisited. The atomically flat sapphire substrate we use is particularly suited to optical measurements of the isolated quantum dots, enabling combined manipulation–spectroscopy experiments on a single particle. Automated nanoparticle manipulation and imaging routines have been developed so as to facilitate the rapid assembly of specific nanoparticle arrangements.
Highlights
Techniques such as scanning probe microscopy and transmission electron microscopy have been used extensively to provide crucial high-resolution structural and morphological information on nanoscale systems
These include scanning near-field optical microscopy (SNOM) [1,2,3] and techniques based on adaptations of single-molecule spectroscopy [4], such as fluorescence imaging with one-nanometer accuracy (FIONA) [5], stochastic optical reconstruction microscopy (STORM) [6]
An AFM height image for cells A1–B1, using our reference notation detailed below, is shown in Figure 1c This enabled the re-location of single nanoparticles so that they could be analysed using a number of different techniques including optical microscopy, single-molecule microscopy, and atomic force microscopy
Summary
Techniques such as scanning probe microscopy and transmission electron microscopy have been used extensively to provide crucial high-resolution structural and morphological information on nanoscale systems. In a challenging recent experiment, atomic force microscopy (AFM) was used to manipulate a single gold nanoparticle (≈35 nm) to approach a single quantum dot [13].
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