Abstract
Measurement modalities in Bragg coherent diffraction imaging (BCDI) rely on finding a signal from a single nanoscale crystal object which satisfies the Bragg condition among a large number of arbitrarily oriented nanocrystals. However, even when the signal from a single Bragg reflection with (hkl) Miller indices is found, the crystallographic axes on the retrieved three-dimensional (3D) image of the crystal remain unknown, and thus localizing in reciprocal space other Bragg reflections becomes time-consuming or requires good knowledge of the orientation of the crystal. Here, the commissioning of a movable double-bounce Si (111) monochromator at the 34-ID-C endstation of the Advanced Photon Source is reported, which aims at delivering multi-reflection BCDI as a standard tool in a single beamline instrument. The new instrument enables, through rapidswitching from monochromatic to broadband (pink) beam, the use of Lauediffraction to determine crystal orientation. With a proper orientation matrixdetermined for the lattice, one can measure coherent diffraction patterns near multiple Bragg peaks, thus providing sufficient information to image the full strain tensor in 3D. The design, concept of operation, the developed procedures for indexing Laue patterns, and automated measuring of Bragg coherent diffraction data from multiple reflections of the same nanocrystal arediscussed.
Highlights
Macroscopic properties of crystalline materials depend on their atomic structure, dimensionality and other nanoscale phenomena
We present the developed procedures and capabilities that allow multi-reflection Bragg coherent X-ray diffraction imaging (BCDI) at a single beamline instrument
The concept of operation relies on obtaining the crystallographic orientations of arbitrarily oriented submicrometre crystals utilizing a broadband X-ray beam for Laue diffraction and a monochromatic beam for BCDI from different Bragg reflections (Cha et al, 2016a)
Summary
Macroscopic properties of crystalline materials depend on their atomic structure, dimensionality and other nanoscale phenomena. In micrometre- to nanometre-scale dimensions, the knowledge of the crystallographic orientation and full strain tensor are important pieces of information for predicting the mechanical properties of submicrometre particles and crystal grains of polycrystalline materials (Cherukara et al, 2018a). The concept of operation relies on obtaining the crystallographic orientations of arbitrarily oriented submicrometre crystals utilizing a broadband X-ray beam for Laue diffraction and a monochromatic beam for BCDI from different Bragg reflections (Cha et al, 2016a). By collecting at least three reflections, the three-dimensional (3D) image of the strain tensor of a nanocrystal can be obtained This unique capability will be crucial for investigating properties of crystalline materials where the knowledge of the crystallographic orientation with respect to the axis of external stimuli is imperative (Pateras et al, 2019; Newton et al, 2009)
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