Abstract
An atomic force microscopy (AFM) cantilever is integrated into to a quartz tuning fork (QTF) to probe the viscoelastic properties of mesoscopic fluid layers confined between two solid surfaces under shear. Two procedures to fabricate the AFM/QTF probe are described herein. In the first, a nano-manipulator is used to transport a commercially available afm cantilever from its chip holder to the edge of a QTF tine. In the second, an afm cantilever is fabricated at the edge of the QTF tine itself. In both cases we exploit the capabilities of a dual-beam system (focused ion beam/scanning electron microscope), equipped with Omni-Probe nano-manipulator and a Gas Injection System (GIS). The new device improves the ability of shear-force acoustic near-field microscopy (SANM) to monitor the constraining normal and damping shear forces exerted by the solid boundaries, concurrently with the acoustic emission from the trapped fluid.
Highlights
Shear-force Acoustic Near-field Microscopy (SANM) was recently introduced as a metrology tool to characterize the dynamic behavior of mesoscopic fluids trapped between two solid boundaries under relative shear motion
This scenario is akin to interfacial friction phenomena where the dissipation of energy is attributed to inelastic interactions between the solid boundaries and the confined fluid layer The added acoustic detection capability brought by the new SANM technique allows contrasting the acoustic signal emitted by the fluid with the information obtained from the simultaneously acquired damping shear-force acting on the probe, which illustrates the improved metrology capabilities offered by SANM
We focus in the description of an atomic force microscopy (AFM)/quartz tuning fork (QTF) probe fabrication method
Summary
Shear-force Acoustic Near-field Microscopy (SANM) was recently introduced as a metrology tool to characterize the dynamic behavior of mesoscopic fluids trapped between two solid boundaries under relative shear motion. One issue in the SANM field is the inconclusive knowledge of the absolute value of the probe-substrate separation distance, i.e. there is an uncertainty about the exact location of the substrate [6] This causes ambiguity when interpreting the probe-fluid interaction mechanisms as a function of probesample separation distance. Atomic Force Microscopy, by contrast, allows a direct vertical spatial mapping of the normal force components of the interaction as a function of probe-sample separation distance. In subsequent work we plan to use this system to obtain approach curves that monitor normal force, lateral shear force, lateral displacement and the acoustic amplitude to spatially map probe-sample interactions as a function of separation distance. The QTF was first adhered (using cyanoacrylate) to a commercial stainless steel mount in such a way that the tines oscillate parallel to the sample surface
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