Abstract
In recent years several studies have shown that the X chart with variable sampling intervals (VSI), the X chart with variable size (VSS), the X chart with variable sample size and sampling intervals (VSSI) and the X chart with variable parameters (VP) detect both small and moderate shifts in the process mean more quickly than the traditional Shewhart X chart. Double sampling is the counterpart to double sampling plans. A combined double sampling variable sampling interval (DSVSI) X chart is studied in this paper. It is compared with the aforementioned charts and with the CUSUM and EWMA charts. In all cases, the DSVSI X chart is quicker at detecting small and moderate shifts in the process mean. An example is provided.
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