Abstract
The paper introduces the development of a new voltage response measurement method to determine the dielectric response function of insulating materials. This new method is based on a non-contact electrostatic voltage follower. In this technique, the voltage of the measuring probe follows the surface potential. The probe voltage is connected to the guarding electrode and helps to increase the impedance of the equipment. The paper introduces the built-up of the equipment and the relationship between the slopes of decay and return voltages and the dielectric response function.
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