Abstract
We have placed a scanning tunneling microscope (STM) in the sample stage of a scanning electron microscope (SEM). This allows us to focus the tip on a preselected spot for STM operation with a precision of 0.5 μm. We are able to check the state of the sample and the tip during STM operation by simultaneous use of the SEM. We are also able to correlate the images given by both techniques.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
