Color-mapping techniques for computer-aided design and verification of VLSI systems

Abstract

Color raster-scan displays are often equipped with hardware for color transformation. Because the transformation can be redefined much more quickly than a full image can be computed (in a host) and subsequently displayed, it is preferable when possible to perform image operations by simply changing the mapping. Here an interactive layout system for NMOS VLSI is described which gives immediate feedback in color. Viewing modes are emphasized; opaque and translucent modes are discussed which allow the flexibility required for efficient understanding of the design by the designer. The color table is also used to help the designer detect violations of design rules; design rule violations can be readily detected when the transformation unit is used to highlight overlaps of selected VLSI layers or fringe structures derived from them. These color-mapping methods for man-machine interaction promise to enhance the productivity of the designer considerably, and they point the way to VLSI design systems of the future.